Dynamic 1-tier scan for high performance 3D NAND
US10714198B1 · kind B1 · utility
4Cited by
1References
12Claims
0Family size
Assignee
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Key dates
| Filing date | Jun 4, 2019 |
| Grant date | Jul 14, 2020 |
| Priority date | — |
| Expiry date | Jun 4, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for executing a dynamic 1-tier scan on a memory array are provided. The memory array includes a plurality of memory cells organized into a plurality of sub-groups. The dynamic 1-tier scan includes executing an program loop in which cells of a first sub-group are counted to determine whether a numeric threshold is met, and, if the numeric threshold is met with respect to the first sub group, at least one additional program loop is executed in which cells of a second sub-group are counted to determine whether the numeric threshold is met with respect to the second sub-group.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.