Apparatus and methods for testing devices
US10718805B2 · kind B2 · utility
1Cited by
2References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 26, 2017 |
| Grant date | Jul 21, 2020 |
| Priority date | — |
| Expiry date | Jun 19, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/44
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure includes apparatuses and methods related to test devices, for example testing devices by measuring signals emitted by a device. One example apparatus can include a first portion including a number of sidewalls positioned to at least partially surround a device under test; and a second portion electrically coupled to the first portion, wherein the second portion is configured to move in the x-direction, the y-direction, and z-direction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.