Constrained pseudorandom test pattern for in-system logic built-in self-test

US10746790B1 · kind B1 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Alejandro Alberto Cook Lobo · Renningen, DE
• Thomas Gentner · Eppelheim, DE
• Daniel Kiss · Stuttgart, DE
• Jens Kuenzer · Eppelheim, DE

Key dates

• Filing date: Mar 25, 2019
• Grant date: Aug 18, 2020
• Expiry date: Mar 25, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/3187
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Embodiments of the invention are directed to a built-in self-test system for an electronic circuit. The system includes a memory having two or more base seeds stored thereon. The system further includes seed generation logic configured to generate, based at least in part on the two or more base seeds, a plurality of generated seeds. The generated seeds can be constructed from the base seeds such that each of the generated seeds encodes a test pattern that satisfies a functional constraint. A finite state machine is configured to generate, based on the plurality of generated seeds, a sequence of constrained pseudorandom test patterns. A test controller is operable to place the electronic circuit into a test mode based on the constrained pseudorandom test pattern.