Patent · US Active

ATE compatible high-efficient functional test

US10768232B2 · kind B2 · utility

0Cited by

9References

17Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Thomas Gentner · Eppelheim, DE
Jens Kuenzer · Eppelheim, DE
Cedric Lichtenau · Stuttgart, DE
Martin Padeffke · Hildrizhausen, DE

Key dates

Filing date	Jul 14, 2017
Grant date	Sep 8, 2020
Priority date	—
Expiry date	Dec 19, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/2236
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method, computer program product and/or system is disclosed. According to an aspect of this invention, a device under test (DUT) is switched to a functional test mode. In some embodiments of the present invention, the DUT receives a general scan design (GSD) pattern while in the functional test mode. In some embodiments, the DUT executes a first functional test corresponding to the GSD pattern. In yet other embodiments, the DUT further comprises a state machine that controls the execution of the first functional test. The DUT may further store the output address, the output data, and the status to an address register, a data register, and a status register, respectively and/or send the output address, the output data, and the status to an address register to an automatic testing equipment (ATE).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.