Adaptive scan frequency for detecting errors in a memory system
US10846165B2 · kind B2 · utility
2Cited by
14References
20Claims
0Family size
Assignee
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Key dates
| Filing date | May 17, 2018 |
| Grant date | Nov 24, 2020 |
| Priority date | — |
| Expiry date | Feb 1, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/0411
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Performing a first set of scans on a memory device in a memory system with a first time interval between each scan of the first set of scans to detect errors on the memory device, determining, from performing the first set of scans, that a rate of errors being detected on the memory device is changing, and performing a second set of scans with a second time interval between each scan of the second set of scans to detect errors on the memory device, in response to determining that the rate of errors being detected on the memory device is changing, wherein the second time interval is different than the first time interval.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.