Inductive testing probe apparatus for testing semiconductor die and related systems and methods
US10852344B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 12, 2017 |
| Grant date | Dec 1, 2020 |
| Priority date | — |
| Expiry date | Aug 19, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/681
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing probe apparatus for testing die. The testing probe may include a probe interface and a carrier for supporting at least one die comprising 3DI structures. The probe interface may be positionable on a first side of the at least one die and include a voltage source and at least one first inductor operably coupled to the voltage source. A voltage sensor and at least one second inductor coupled to the voltage sensor may be disposed on a second opposing side of the at least one die. The voltage source of the probe interface may be configured to inductively cause a voltage within the 3DI structures of the at least one die via the at least one first inductor. The voltage sensor may be configured to sense a voltage within the at least one 3DI structure via the at least one second inductor. Related systems and methods are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.