Inspection and replacement method for micro LED
US10872828B2 · kind B2 · utility
1Cited by
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3Claims
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Assignee
Inventors
Key dates
| Filing date | Mar 29, 2019 |
| Grant date | Dec 22, 2020 |
| Priority date | — |
| Expiry date | Mar 29, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10H20/8506
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
The present invention relates to an inspection and replacement method for a micro LED, the method being configured to inspect whether the micro LED is defective and replace a defective micro LED with a normal micro LED. More particularly, the present invention relates to an inspection and replacement method for a micro LED in which when micro LEDs are transferred to a display substrate, the micro LEDs are inspected so as to detect and remove a defective micro LED, and a normal micro LED is placed at a position where the defective micro LED is removed so as to be replaced with the defective micro LED.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.