Patent · US Active

Substrate processing apparatus and substrate processing method

US10923329B2 · kind B2 · utility

0Cited by
4References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 11, 2019
Grant dateFeb 16, 2021
Priority date
Expiry dateSep 11, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/334
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An apparatus for processing reaction products that are deposited when an etching target film contained in a target object to be processed is etched is provided with: a processing chamber; a partition plate; a plasma source; a mounting table; a first processing gas supply unit; a second processing gas supply unit. The processing chamber defines a space, and the partition plate is arranged within the processing chamber and divides the space into a plasma generating space and a substrate processing space, while suppressing permeation of ions and vacuum ultraviolet rays. The plasma source generates a plasma in the plasma forming space. The mounting table is arranged in the substrate processing space to mount the target object thereon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.