Method and system for determining molecular structure
US10935506B2 · kind B2 · utility
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1References
18Claims
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Key dates
| Filing date | Jun 24, 2019 |
| Grant date | Mar 2, 2021 |
| Priority date | — |
| Expiry date | Jun 24, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/612
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Molecular structure may be determined based on structure factors solved from the diffraction pattern and the electron microscopy image of the sample. In particular, the amplitudes of the structure factors may be determined based on intensities of diffraction peaks in the multiple diffraction patterns. The phases of the structure factors may be determined based on electron microscopy images and the intensities of the diffraction peaks.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.