Bart Buijsse
36Patents
7h-index
45Co-inventors
69Inventor score
Filing activity: Dec 19, 2000 → May 22, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7317515B2 | Method of localizing fluorescent markers | Electricity | 18 | Expired |
| US7906762B2 | Compact scanning electron microscope | Electricity | 15 | Active |
| US7067820B2 | Particle-optical apparatus with a permanent-magnetic lens and an electrostatic lens | Electricity | 14 | Expired |
| US8309921B2 | Compact scanning electron microscope | Electricity | 13 | Active |
| US8772716B2 | Phase plate for a TEM | Electricity | 10 | Active |
| US7456413B2 | Apparatus for evacuating a sample | Electricity | 10 | Active |
| US7064325B2 | Apparatus with permanent magnetic lenses | Electricity | 9 | Expired |
| US7301157B2 | Cluster tool for microscopic processing of samples | Electricity | 7 | Expired |
| US9129774B2 | Method of using a phase plate in a transmission electron microscope | Electricity | 7 | Active |
| US8093558B2 | Environmental cell for a particle-optical apparatus | Electricity | 6 | Active |
| US11183364B1 | Dual beam microscope system for imaging during sample processing | Electricity | 6 | Active |
| US9312098B2 | Method of examining a sample in a charged-particle microscope | Electricity | 6 | Active |
| US8637821B2 | Blocking member for use in the diffraction plane of a TEM | Electricity | 4 | Active |
| US8633456B2 | Method for centering an optical element in a TEM comprising a contrast enhancing element | Electricity | 4 | Active |
| US7285785B2 | Apparatus with permanent magnetic lenses | Electricity | 4 | Expired |
| US8835846B2 | Imaging a sample in a TEM equipped with a phase plate | Electricity | 3 | Active |
| US10545100B2 | X-ray imaging technique | Electricity | 3 | Active |
| US8658974B2 | Environmental cell for a particle-optical apparatus | Electricity | 2 | Active |
| US10651008B2 | Diffraction pattern detection in a transmission charged particle microscope | Electricity | 2 | Active |
| US9025018B2 | User interface for an electron microscope | Electricity | 2 | Active |
| US9293297B2 | Correlative optical and charged particle microscope | Electricity | 2 | Active |
| US9006652B2 | Phase shift method for a TEM | Electricity | 1 | Active |
| US9908778B2 | Method of producing a freestanding thin film of nano-crystalline graphite | Electricity | 1 | Active |
| US11101101B2 | Laser-based phase plate image contrast manipulation | Electricity | 1 | Active |
| US10935506B2 | Method and system for determining molecular structure | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.