Patent · US Active

Semiconductor package metal shadowing checks

US10956649B2 · kind B2 · utility

0Cited by
28References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 22, 2019
Grant dateMar 23, 2021
Priority date
Expiry dateAug 22, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2113/20
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Embodiments of the invention include methods, systems, and computer program products for checking metal coverage in a laminate structure. Aspects of the invention include receiving, by a processor, metal shadowing rules and a semiconductor package design comprising a plurality of laminate layers, a plurality of metal power shapes, and a plurality of signal lines. Each metal power shape is mapped to one or more cells in a two-dimensional array. The processor determines, for each signal line in the semiconductor package design, whether the metal power shapes satisfy the metal shadowing rules. The processor displays a list of signal lines that do not satisfy the metal shadowing rules.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.