Patent · US Active

Composition and method for metal CMP

US10968366B2 · kind B2 · utility

0Cited by
16References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 4, 2018
Grant dateApr 6, 2021
Priority date
Expiry dateDec 4, 2038

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/31053
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

A chemical mechanical polishing composition for polishing a substrate includes a liquid carrier and cationic metal oxide abrasive particles dispersed in the liquid carrier. The cationic metal oxide abrasive particles have a surface modified with at least one compound consisting of a silyl group having at least one quaternary ammonium group. A method for chemical mechanical polishing a substrate including a metal layer includes contacting the substrate with the above described polishing composition, moving the polishing composition relative to the substrate, and abrading the substrate to remove a portion of the metal layer from the substrate and thereby polish the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.