Patent · US Active

Partial parameters and projection thereof included within statistical timing analysis

US10970448B2 · kind B2 · utility

0Cited by
3References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 18, 2019
Grant dateApr 6, 2021
Priority date
Expiry dateJul 18, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2119/12
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Systems and methods for improving timing closure of new and existing IC chips by breaking at least one parameter of interest into two or more partial parameters. More specifically, a method is provided for that includes propagating at least one timing analysis run for a semiconductor product. The method further includes identifying at least one parameter of interest used in the at least one timing analysis run. The method further includes splitting the at least one parameter into two parts comprising a controlled part and an uncontrolled part. The method further includes correlating or anti-correlating the controlled part with another parameter used in the at least one timing analysis run. The method further includes projecting timing using the correlation or anti-correlation between the controlled part and the another parameter and using the uncontrolled part of the at least one parameter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.