John P. Dubuque
26Patents
7h-index
24Co-inventors
65Inventor score
Filing activity: Feb 26, 2007 → Jul 18, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7555740B2 | Method and system for evaluating statistical sensitivity credit in path-based hybrid multi-corner static timing analysis | Physics | 20 | Active |
| US8839167B1 | Reducing runtime and memory requirements of static timing analysis | Physics | 17 | Active |
| US8141012B2 | Timing closure on multiple selective corners in a single statistical timing run | Physics | 17 | Active |
| US8413095B1 | Statistical single library including on chip variation for rapid timing and power analysis | Physics | 14 | Active |
| US7784003B2 | Estimation of process variation impact of slack in multi-corner path-based static timing analysis | Physics | 10 | Active |
| US8468483B2 | Method, system and program storage device for performing a parameterized statistical static timing analysis (SSTA) of an integrated circuit taking into account setup and hold margin interdependence | Physics | 7 | Active |
| US9519747B1 | Dynamic and adaptive timing sensitivity during static timing analysis using look-up table | Physics | 7 | Active |
| US8560989B2 | Statistical clock cycle computation | Physics | 6 | Active |
| US7681157B2 | Variable threshold system and method for multi-corner static timing analysis | Physics | 6 | Active |
| US8769452B2 | Parasitic extraction in an integrated circuit with multi-patterning requirements | Physics | 6 | Active |
| US7886246B2 | Methods for identifying failing timing requirements in a digital design | Physics | 6 | Active |
| US8850378B2 | Hierarchical design of integrated circuits with multi-patterning requirements | Physics | 6 | Active |
| US8949765B2 | Modeling multi-patterning variability with statistical timing | Physics | 5 | Active |
| US8768679B2 | System and method for efficient modeling of NPskew effects on static timing tests | Physics | 5 | Active |
| US8056035B2 | Method and system for analyzing cross-talk coupling noise events in block-based statistical static timing | Physics | 5 | Active |
| US8806402B2 | Modeling multi-patterning variability with statistical timing | Physics | 4 | Active |
| US8656207B2 | Method for modeling variation in a feedback loop of a phase-locked loop | Electricity | 3 | Active |
| US7844932B2 | Method to identify timing violations outside of manufacturing specification limits | Emerging Cross-Sectional Technologies | 3 | Active |
| US9378328B2 | Modeling multi-patterning variability with statistical timing | Physics | 2 | Active |
| US9348962B2 | Hierarchical design of integrated circuits with multi-patterning requirements | Physics | 2 | Active |
| US9858368B2 | Integrating manufacturing feedback into integrated circuit structure design | Physics | 2 | Active |
| US7797657B2 | Parameter ordering for multi-corner static timing analysis | Physics | 1 | Active |
| US9171124B2 | Parasitic extraction in an integrated circuit with multi-patterning requirements | Physics | 1 | Active |
| US10394982B2 | Partial parameters and projection thereof included within statistical timing analysis | Physics | 0 | Active |
| US10970448B2 | Partial parameters and projection thereof included within statistical timing analysis | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.