Single plane illumination microscope

US10983322B2 · kind B2 · utility

Assignee

• Carl Zeiss Microscopy GmbH · DE

Inventors

• Thomas Kalkbrenner · Jena, DE
• Ralf Netz · Jena, DE
• Helmut Lippert · Jena, DE
• Joerg Siebenmorgen · Jena, DE

Key dates

• Filing date: Oct 20, 2017
• Grant date: Apr 20, 2021
• Expiry date: Apr 9, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B21/32
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

A single plane illumination microscope having an illumination optical system for illuminating a sample located on a sample carrier in a medium, and which is parallel to a planar reference surface. The sample is illuminated by a light sheet via an illumination light path. A detection optical system has a detection beam path. The optical axes of the illumination and detection optical systems each define an angle that is not equal to zero degrees along with the normal to the reference surface. A barrier layer system includes at least one layer of a given material having a given thickness and separates the medium from the illumination and detection optical systems. A base area of the barrier layer system is in contact with the region that is accessible for illumination and detection activities, said base area running parallel to the reference surface. At least one corrective element in the illumination beam path and/or the detection beam path allows those aberrations to be reduced which are created when light to be detected or light for illuminating the sample penetrates interfaces of the barrier layer system at an angle. The microscope has means, which are independent of the generatio…