Patent · US Active

Testing fuse configurations in semiconductor devices

US11009548B2 · kind B2 · utility

0Cited by
151References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 24, 2019
Grant dateMay 18, 2021
Priority date—
Expiry dateNov 25, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2224/48145
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Methods, systems, and apparatus for testing semiconductor devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.