Semiconductor devices including a metal silicide layer and methods for manufacturing thereof
US11063014B2 · kind B2 · utility
0Cited by
2References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 15, 2019 |
| Grant date | Jul 13, 2021 |
| Priority date | — |
| Expiry date | May 15, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/048
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A semiconductor device includes a silicon layer, a metal silicide layer arranged directly on the silicon layer, and a solder layer arranged directly on the metal silicide layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.