Laser-based phase plate image contrast manipulation
US11101101B2 · kind B2 · utility
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25Claims
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Key dates
| Filing date | Apr 22, 2020 |
| Grant date | Aug 24, 2021 |
| Priority date | — |
| Expiry date | Apr 22, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2802
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Methods and systems for implementing laser-based phase plate image contrast enhancement are disclosed herein. An example method at least includes forming at least one optical peak in a diffraction plane of an electron microscope, and directing an electron beam through the at least one optical peak at a first location, where the first location determines an amount of phase manipulation the optical peak imparts to an electron of the electron beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.