Environment control apparatus and chip testing system
US11119147B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 14, 2020 |
| Grant date | Sep 14, 2021 |
| Priority date | — |
| Expiry date | Apr 24, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/56016
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An environment control device and a chip testing system are provided. An apparatus body of the environment control device includes a plurality of accommodating chambers. Each of the accommodating chambers has a temperature adjusting device disposed therein. Each of the accommodating adjusting devices includes a temperature adjuster, a contacting structure, a frame body, and an elastic annular enclosed member. When a chip testing device carrying a plurality of chips is disposed in one of the accommodating chambers, and the contacting structure contacts one side of the chips, the elastic annular enclosed member is abutted against the chip testing device, and the chip testing device and the contacting structure jointly define an enclosed space. The temperature adjuster can correspondingly adjust the temperature of the contacting structure so that the chip testing device can perform a predetermined testing process on the chips in a predetermined temperature environment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.