Patent assignee · US · COMPANY

ONE TEST SYSTEMS

20Patents
20Active
20Granted
51Portfolio score

Filing activity: Aug 27, 2019 → Dec 21, 2021

Most-cited patents

PatentTitleAreaCited byStatus
US10955466B2 Environment control apparatus Physics 26 Active
US10726183B1 Testing apparatus Physics 2 Active
US11226362B2 System-level testing apparatus and system-level testing system Physics 2 Active
US11366136B2 Pressing assembly and chip testing apparatus Electricity 2 Active
US11119147B2 Environment control apparatus and chip testing system Physics 2 Active
US11183265B2 Environment control apparatus Physics 1 Active
US11327866B2 Memory test method Physics 1 Active
US11022643B2 Testing apparatus Physics 1 Active
US11327111B2 Environment control apparatus and chip testing system Physics 1 Active
US11366155B2 Chip testing device and chip testing system for testing memory chips Physics 1 Active
US11193971B2 Chip testing method for testing chips by chip testing system Electricity 1 Active
US11327110B2 Chip testing system for testing chips Physics 1 Active
US11366159B2 Chip tray kit and chip testing apparatus Physics 0 Active
US11287466B2 Chip testing circuit and testing method thereof Physics 0 Active
US11428711B2 Testing apparatus Emerging Cross-Sectional Technologies 0 Active
US11630148B2 Chip testing apparatus Physics 0 Active
US11435396B2 Chip testing system Physics 0 Active
US11125809B2 Chip testing device Electricity 0 Active
US11624776B2 Temperature adjusting device Physics 0 Active
US11029333B2 Testing apparatus, chip carrying device, and electrically connecting unit Physics 0 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.