Chen-Lung Tsai
22Patents
2h-index
6Co-inventors
46Inventor score
Filing activity: Dec 15, 2009 → Dec 21, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10955466B2 | Environment control apparatus | Physics | 26 | Active |
| US8435837B2 | Panel based lead frame packaging method and device | Electricity | 3 | Active |
| US8663485B2 | Method of manufacturing plastic metallized three-dimensional circuit | Emerging Cross-Sectional Technologies | 2 | Active |
| US11226362B2 | System-level testing apparatus and system-level testing system | Physics | 2 | Active |
| US11119147B2 | Environment control apparatus and chip testing system | Physics | 2 | Active |
| US11366136B2 | Pressing assembly and chip testing apparatus | Electricity | 2 | Active |
| US10726183B1 | Testing apparatus | Physics | 2 | Active |
| US11022643B2 | Testing apparatus | Physics | 1 | Active |
| US11366155B2 | Chip testing device and chip testing system for testing memory chips | Physics | 1 | Active |
| US11327866B2 | Memory test method | Physics | 1 | Active |
| US11183265B2 | Environment control apparatus | Physics | 1 | Active |
| US11327110B2 | Chip testing system for testing chips | Physics | 1 | Active |
| US11327111B2 | Environment control apparatus and chip testing system | Physics | 1 | Active |
| US11193971B2 | Chip testing method for testing chips by chip testing system | Electricity | 1 | Active |
| US11287466B2 | Chip testing circuit and testing method thereof | Physics | 0 | Active |
| US11428711B2 | Testing apparatus | Emerging Cross-Sectional Technologies | 0 | Active |
| US11624776B2 | Temperature adjusting device | Physics | 0 | Active |
| US11630148B2 | Chip testing apparatus | Physics | 0 | Active |
| US11125809B2 | Chip testing device | Electricity | 0 | Active |
| US11435396B2 | Chip testing system | Physics | 0 | Active |
| US11366159B2 | Chip tray kit and chip testing apparatus | Physics | 0 | Active |
| US11029333B2 | Testing apparatus, chip carrying device, and electrically connecting unit | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.