Patent · US Active

Test data integration system and method thereof

US11120037B2 · kind B2 · utility

0Cited by
7References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 4, 2019
Grant dateSep 14, 2021
Priority date
Expiry dateOct 4, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F21/44
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test data integration system and a method thereof are provided. The method includes: collecting, by each of a plurality of client devices, a plurality of test information obtained from coupled automatic test equipment when performing a test operation, and transmitting the plurality of test information to a server; receiving, by the server, the plurality of test information, and generating a graphical user interface according to the plurality of test information and displaying an integration analysis result corresponding to the plurality of test information.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.