Patent · US Active

Plasma processing apparatus and techniques

US11120973B2 · kind B2 · utility

0Cited by
4References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 10, 2019
Grant dateSep 14, 2021
Priority date
Expiry dateAug 6, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/265
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An apparatus may include a main chamber, a substrate holder, disposed in a lower region of the main chamber, and defining a substrate region, as well as an RF applicator, disposed adjacent an upper region of the main chamber, to generate an upper plasma within the upper region. The apparatus may further include a central chamber structure, disposed in a central portion of the main chamber, where the central chamber structure is disposed to shield at least a portion of the substrate position from the upper plasma. The apparatus may include a bias source, electrically coupled between the central chamber structure and the substrate holder, to generate a glow discharge plasma in the central portion of the main chamber, wherein the substrate region faces the glow discharge region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.