Chip testing device
US11125809B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 3, 2020 |
| Grant date | Sep 21, 2021 |
| Priority date | — |
| Expiry date | Apr 15, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B1/02
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A chip testing device for being transferred among a plurality of working stations includes a circuit board, a control set, and a plurality of connection terminals. The circuit board is provided with a plurality of electrical connection sockets disposed thereon each for carrying a chip. The control set includes a plurality of testing modules disposed on the circuit board. The connection terminals are disposed on the circuit board. When the connection terminals are connected to an external power supply device, the testing modules are connected to the electrical connection sockets, and each of the testing modules is able to test the chip on the electrical connection socket connected thereto.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.