Optimization and scheduling of the handling of devices in the automation process
US11156659B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 13, 2018 |
| Grant date | Oct 26, 2021 |
| Priority date | — |
| Expiry date | Mar 6, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3172
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for performing an automated test is disclosed. The method comprises receiving a plurality of work orders and a plurality of constraints for scheduling a plurality of tests on a plurality of DUTs using automated test equipment (ATE) available on a production floor, wherein the ATE comprises a plurality of test cells, and wherein each test cell comprises a plurality of testers and an automated handler. The method further comprises developing a test plan to execute the plurality of tests, wherein the test plan is customized in accordance with the information in the plurality of work orders and the plurality of constraints. Finally, the method comprises scheduling the plurality of tests to the plurality of test cells to maximize throughput of the plurality of DUTs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.