Patent · US Active

Read window based on program/erase cycles

US11189355B1 · kind B1 · utility

0Cited by
10References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 25, 2020
Grant dateNov 30, 2021
Priority date
Expiry dateAug 25, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/349
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A first group of memory cells of a memory device can be subjected to a particular quantity of program/erase cycles (PECs) in response to a programming operation performed on a second group of memory cells of the memory device. Subsequent to subjecting the first group of memory cells to the particular quantity of PECs, a data retention capability of the first group of memory cells can be assessed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.