Apparatuses and methods for ZQ calibration
US11237579B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 6, 2020 |
| Grant date | Feb 1, 2022 |
| Priority date | — |
| Expiry date | Aug 6, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/4402
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In an example semiconductor device, the voltage/temperature conditions of the semiconductor device and associated calibration codes of multiple instances of ZQ calibrations are pre-stored in a register array. When a pre-stored voltage/temperature condition occurs again, ZQ calibration is not performed. Instead, the associated pre-stored calibration code is retrieved from the register array and provided to the IO circuit. When a voltage/temperature condition of the semiconductor device does not match any pre-stored voltage/temperature condition in the register array, a ZQ calibration is performed. When the ZQ calibration is performed, a register in the register array is selected according to an update policy and updated by the calibration code newly provided by the ZQ calibration along with the voltage/temperature condition at the time when the ZQ calibration is performed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.