Examination apparatus, examination method, recording medium storing an examination program, learning apparatus, learning method, and recording medium storing a learning program
US11244443B2 · kind B2 · utility
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15Claims
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Key dates
| Filing date | Jul 28, 2019 |
| Grant date | Feb 8, 2022 |
| Priority date | — |
| Expiry date | Dec 19, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Provided is an examination apparatus including a target image acquiring section that acquires a target image obtained by capturing an examination target; a target image masking section that masks a portion of the target image; a masked region predicting section that predicts an image of a masked region that is masked in the target image; a reproduced image generating section that generates a reproduced image using a plurality of predicted images predicted respectively for the plurality of masked regions; and a difference detecting section that detects a difference between the target image and the reproduced image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.