Patent · US Active

Test apparatus and testing method using the same

US11249131B2 · kind B2 · utility

0Cited by

0References

20Claims

0Family size

Assignee

TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. · TW

Inventors

Harry-Hak-Lay Chuang · Austin, US
Tien-Wei Chiang · Taipei, TW
Chia Yu Wang · Hengshan, TW
Meng-Chun Shih · Hsinchu, TW
Ching-Huang Wang · Taipei, TW
Chih-Yang Chang · 員林市, TW
Chia-Hsiang Chen · Sunnyvale, US
Chih-Hui Weng · Tainan, TW

Key dates

Filing date	Apr 1, 2020
Grant date	Feb 15, 2022
Priority date	—
Expiry date	Aug 7, 2040

Classification

Technology area (CPC H)Electricity
CPC primaryH01L2924/0002
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test apparatus includes a tray including at least a first region and a second region, and a cap disposed over the tray. The cap includes a cap body, and at least a first magnet and a second magnet disposed over the cap body. The first magnet is configured to provide a first magnetic field to the first region of the tray, and the second magnet is configured to provide a second magnetic field to the second region of the tray. A strength of the first magnetic field is different from a strength of the second magnetic field.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.