Patent · US Active

Probing apparatus and method of operating the same

US11307246B2 · kind B2 · utility

1Cited by
1References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 24, 2019
Grant dateApr 19, 2022
Priority date
Expiry dateFeb 12, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/07342
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A probing apparatus includes a chuck supporting a DUT, and a platform with an opening above the chuck. The probing apparatus further includes first and second rails positioned at first and second sides of the platform, respectively. The probing apparatus further includes a probing device, the probing device includes a probing module slidably along the first and second rails, and a first motor system configured to automatically align a probe card with the DUT. The probing module includes a third rail with two ends slidably attached to the first and second rails, respectively, a probing stage slidably attached to the third rail, and the probe card attached to the probing stage. The first motor system includes a first motor configured to control movement of the probing stage along the third rail, and a second motor configured to control movement of the probing module along the first and second rails.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.