Yi Ming Lau
6Patents
1h-index
3Co-inventors
40Inventor score
Filing activity: Mar 18, 2008 → Apr 14, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11307246B2 | Probing apparatus and method of operating the same | Physics | 1 | Active |
| US11054465B2 | Method of operating a probing apparatus | Physics | 1 | Active |
| US10890614B2 | Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under test | Electricity | 0 | Active |
| US8389926B2 | Testing apparatus for light-emitting devices with a design for a removable sensing module | Physics | 0 | Active |
| US7675307B2 | Heating apparatus for semiconductor devices | Physics | 0 | Active |
| US11828789B2 | Test apparatus and jumper thereof | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.