Patent · US Active

Position sensor

US11333985B2 · kind B2 · utility

0Cited by
2References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 5, 2019
Grant dateMay 17, 2022
Priority date
Expiry dateJun 5, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F9/7092
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

The invention provides a position sensor (300) which comprises an optical system (305,306) configured to provide measurement radiation (304) to a substrate (307). The optical system is arranged to receive at least a portion of radiation (309) diffracted by a mark (308) provided on the substrate. A processor (313) is applied to derive at least one position-sensitive signal (312) from the received radiation. The measurement radiation comprises at least a first and a second selected radiation wavelength. The selection of the at least first and second radiation wavelengths is based on a position error swing-curve model.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.