Circuit for detecting pin-to-pin leaks of an integrated circuit package
US11372056B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 26, 2020 |
| Grant date | Jun 28, 2022 |
| Priority date | — |
| Expiry date | Oct 10, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/64
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques and apparatuses are provided for detecting a short circuit between pins of an integrated circuit package. The tested pins can be adjacent or non-adjacent on the package. Various types of short circuits can be detected, including resistive, diode and capacitive short circuits. Additionally, short circuits of a single pin can be tested, including a short circuit to a power supply or to ground. The test circuit includes a current mirror, where the input path has a first path connected to a first pin and a parallel second path connected to a second pin. A comparator is connected to the output path of the current mirror. By controlling the on and off states of transistors in the first and second paths, and evaluating the voltage of the output path, the short circuits can be detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.