Patent · US Active

High-resolution scanning microscopy

US11372223B2 · kind B2 · utility

1Cited by

8References

26Claims

0Family size

Assignee

Carl Zeiss Microscopy GmbH · DE

Inventors

Ingo Kleppe · Jena, DE
Yauheni Novikau · Jena, DE
Christoph Nieten · Jena, DE
Ralf Netz · Jena, DE

Key dates

Filing date	Mar 19, 2019
Grant date	Jun 28, 2022
Priority date	—
Expiry date	Mar 19, 2039

Classification

Technology area (CPC H)Electricity
CPC primaryH04N7/183
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

A microscope and method for high resolution scanning microscopy of a sample, having an illumination device, an imaging device for the purpose of scanning at least one point or linear spot across the sample and of imaging the point or linear spot into a diffraction-limited, static single image below a reproduction scale in a detection plane. A detector device is used for detecting the single image in the detection plane for various scan positions, with a location accuracy which, taking into account the reproduction scale in at least one dimension/measurement, is at least twice as high as a full width at half maximum of the diffraction-limited single image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.