Patent · US Active

Offset head-spindle for chemical mechanical polishing

US11389925B2 · kind B2 · utility

0Cited by
21References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 20, 2019
Grant dateJul 19, 2022
Priority date
Expiry dateJul 17, 2040

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/105
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A polishing system is provided, including a carrier with an offset distance. The offset distance allows a shifted carrier head to cover more surface area of the polishing surface. The offset distance effectively provides an additional rotation of the carrier head about the axis, which allows for a greater area traversed on the polishing surface, improving chemical mechanical polishing uniformity on the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.