Catalyst enhanced seamless ruthenium gap fill
US11401602B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Jan 4, 2021 |
| Grant date | Aug 2, 2022 |
| Priority date | — |
| Expiry date | Apr 3, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L23/53266
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Methods of depositing a metal film with high purity are discussed. A catalyst enhanced CVD process is utilized comprising an alkyl halide catalyst soak and a precursor exposure. The precursor comprises a metal precursor having the general formula (I): M-L1(L2)y, wherein M is a metal, L1 is an aromatic ligand, L2 is an aliphatic ligand, and y is a number in the range of from 2 to 8 to form a metal film on the substrate surface, wherein the L2 comprises 1,5-hexdiene, 1,4-hexadiene, and less than 5% of 1,3-hexadiene. Selective deposition of a metal film with high purity on a metal surface over a dielectric surface is described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.