Patent · US Active

Chip testing system

US11435396B2 · kind B2 · utility

0Cited by
0References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 15, 2021
Grant dateSep 6, 2022
Priority date
Expiry dateMar 25, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2877
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A chip testing system including a tray kit, an insertion member mounting apparatus, a testing apparatus, an insertion member detaching apparatus, and a conveying apparatus are provided. The chip tray kit includes a tray, a plurality of chip fixing members, and a plurality of auxiliary insertion members. The chip fixing members are fixed to the tray and are configured to carry a plurality of chips. The insertion member mounting apparatus can fix the auxiliary insertion members to a side of the chip fixing members, and the auxiliary insertion members can limit a movement range of the chips in the chip fixing members. The insertion member detaching apparatus can detach the auxiliary insertion members. When the chips are tested, a pressing assembly connected to a temperature adjusting device and reaching a predetermined temperature correspondingly presses a surface of each of the chips.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.