Patent · US Active

Measurement method and measuring jig

US11456199B2 · kind B2 · utility

0Cited by
5References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 27, 2019
Grant dateSep 27, 2022
Priority date
Expiry dateDec 27, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67253
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

In a measurement method, a terminal is brought into contact with an electrode in an electrostatic chuck in contact with a substrate that is grounded. Further, the terminal, the electrostatic chuck and the substrate are fixed, and a current value and a voltage value are measured using an ammeter and a voltmeter, respectively, that are connected to the terminal. In addition, whether or not the terminal and the electrode are electrically connected is determined from a slope of the current value and/or a peak current value based on the measured current value and the voltage value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.