Patent · US Active

Carbon hard masks for patterning applications and methods related thereto

US11469097B2 · kind B2 · utility

1Cited by
16References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 8, 2019
Grant dateOct 11, 2022
Priority date
Expiry dateOct 5, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/0332
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Embodiments herein provide methods of depositing an amorphous carbon layer using a plasma enhanced chemical vapor deposition (PECVD) process and hard masks formed therefrom. In one embodiment, a method of processing a substrate includes positioning a substrate on a substrate support, the substrate support disposed in a processing volume of a processing chamber, flowing a processing gas comprising a hydrocarbon gas and a diluent gas into the processing volume, maintaining the processing volume at a processing pressure less than about 100 mTorr, igniting and maintaining a deposition plasma of the processing gas by applying a first power to one of one or more power electrodes of the processing chamber, maintaining the substrate support at a processing temperature less than about 350° C., exposing a surface of the substrate to the deposition plasma, and depositing an amorphous carbon layer on the surface of the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.