Coordinate measuring machine with vision probe for performing points-from-focus type measurement operations
US11499817B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 29, 2020 |
| Grant date | Nov 15, 2022 |
| Priority date | — |
| Expiry date | Jun 16, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/695
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A coordinate measuring machine (CMM) system is provided including utilization of a vision probe (e.g., for performing operations for determining and/or measuring surface profiles of workpieces, etc.) The angular orientation of the vision probe may be adjusted using a rotation mechanism so that the optical axis of the vision probe is directed toward an angled surface of a workpiece (e.g., in some implementations the optical axis may be approximately perpendicular to the angled workpiece surface). X-axis, y-axis and z-axis slide mechanisms (e.g., moving in mutually orthogonal directions) may in conjunction move the vision probe to acquisition positions along an image stack acquisition axis (which may approximately coincide with the optical axis) for acquiring a stack of images of the angled workpiece surface. Focus curve data may be determined from analysis of the image stack, which indicates 3-dimensional positions of surface points on the angled surface of the workpiece.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.