Travis Eiles
12Patents
6h-index
19Co-inventors
63Inventor score
Filing activity: Mar 24, 1997 → May 29, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5907464A | MOSFET-based power supply clamps for electrostatic discharge protection of integrated circuits | Electricity | 46 | Expired |
| US6876053B1 | Isolation structure configurations for modifying stresses in semiconductor devices | Electricity | 32 | Expired |
| US6570247B1 | Integrated circuit device having an embedded heat slug | Electricity | 21 | Expired |
| US6607928B1 | Integrated circuit device having an embedded heat slug | Electricity | 12 | Expired |
| US6882170B2 | Device speed alteration by electron-hole pair injection and device heating | Physics | 8 | Expired |
| US9651610B2 | Visible laser probing for circuit debug and defect analysis | Physics | 6 | Active |
| US7660054B2 | Thermally controlled sold immersion lens fixture | Physics | 5 | Active |
| US7410858B2 | Isolation structure configurations for modifying stresses in semiconductor devices | Electricity | 3 | Expired |
| US7411269B2 | Isolation structure configurations for modifying stresses in semiconductor devices | Electricity | 2 | Expired |
| US6519744B2 | Semiconductor die manufacture method to limit a voltage drop on a power plane thereof by noninvasively measuring voltages on a power plane | Physics | 2 | Expired |
| US11499817B2 | Coordinate measuring machine with vision probe for performing points-from-focus type measurement operations | Electricity | 1 | Active |
| US10163601B1 | Probe assembly with high bandwidth beam | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.