Patent · US Active

Predictive chip-maintenance

US11531056B2 · kind B2 · utility

0Cited by

6References

28Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Irmgard Escher-Poeppel · Regensburg, DE
Thorsten Meyer · Regensburg, DE
Gerhard Poeppel · Duggendorf, DE

Key dates

Filing date	Apr 15, 2020
Grant date	Dec 20, 2022
Priority date	—
Expiry date	Jul 19, 2040

Classification

Technology area (CPC H)Electricity
CPC primaryH01L2224/96
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The disclosure describes to techniques for detecting field failures or performance degradation of circuits, including integrated circuits (IC), by including additional contacts, i.e. terminals, along with the functional contacts that used for connecting the circuit to a system in which the circuit is a part. These additional contacts may be used to measure dynamic changing electrical characteristics over time e.g. voltage, current, temperature and impedance. These electrical characteristics may be representative of a certain failure mode and may be an indicator for circuit state-of-health (SOH), while the circuit is performing in the field.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.