Patent · US Active

Optical technique for material characterization

US11543294B2 · kind B2 · utility

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1References
14Claims
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Key dates

Filing dateJul 25, 2019
Grant dateJan 3, 2023
Priority date—
Expiry dateJul 25, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J2003/283
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A polarized Raman Spectrometric system for defining parameters of a polycrystaline material, the system comprises a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory. The polarized Raman Spectrometric apparatus generates signal(s) from either small sized spots at multiple locations on a sample or from an elongated line-shaped points on the sample, and the processor analyzes the signal(s) to define the parameters of said polycrystalline material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.