Inventor · Rehovot, IL

Gilad Barak

52Patents
5h-index
32Co-inventors
72Inventor score

Filing activity: Jan 31, 2001 → Jul 1, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US6583630B2 Systems and methods for monitoring wear and/or displacement of artificial joint members, vertebrae, segments of fractured bones and dental implants Human Necessities 197 Expired
US6573706B2 Method and apparatus for distance based detection of wear and the like in joints Human Necessities 62 Expired
US8848185B2 Optical system and method for measuring in three-dimensional structures Electricity 8 Active
US10359369B2 Metrology test structure design and measurement scheme for measuring in patterned structures Physics 7 Active
US10216098B2 Test structure for use in metrology measurements of patterns Electricity 7 Active
US10209206B2 Method and system for determining strain distribution in a sample Physics 5 Active
US10161885B2 Optical phase measurement method and system Physics 3 Active
US10073045B2 Optical method and system for measuring isolated features of a structure Physics 2 Active
US10732116B2 Hybrid metrology method and system Physics 2 Active
US10564106B2 Raman spectroscopy based measurements in patterned structures Physics 2 Active
US9140544B2 Optical system and method for measuring in patterned structures Electricity 1 Active
US11802829B2 Method and system for broadband photoreflectance spectroscopy Physics 1 Active
US10876959B2 Method and system for optical characterization of patterned samples Physics 1 Active
US10365231B2 Optical phase measurement method and system Physics 1 Active
US9897553B2 Optical phase measurement method and system Physics 1 Active
US11740183B2 Accurate Raman spectroscopy Physics 1 Active
US9651498B2 Optical method and system for detecting defects in three-dimensional structures Physics 1 Active
US11099142B2 X-ray based measurements in patterned structure Physics 1 Active
US11143601B2 Test structure design for metrology measurements in patterned samples Physics 1 Active
US10054423B2 Optical method and system for critical dimensions and thickness characterization Physics 1 Active
US12372473B2 Accurate Raman spectroscopy Physics 0 Active
US10365163B2 Optical critical dimension metrology Physics 0 Active
US12152993B2 Accurate Raman spectroscopy Physics 0 Active
US11543294B2 Optical technique for material characterization Physics 0 Active
US12025560B2 Hybrid metrology method and system Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.