Yonatan Oren
21Patents
2h-index
8Co-inventors
42Inventor score
Filing activity: Dec 15, 2016 → Jul 1, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10564106B2 | Raman spectroscopy based measurements in patterned structures | Physics | 2 | Active |
| US10732116B2 | Hybrid metrology method and system | Physics | 2 | Active |
| US11740183B2 | Accurate Raman spectroscopy | Physics | 1 | Active |
| US11293871B2 | Raman spectroscopy based measurement system | Physics | 1 | Active |
| US11802829B2 | Method and system for broadband photoreflectance spectroscopy | Physics | 1 | Active |
| US11150190B2 | Hybrid metrology method and system | Physics | 0 | Active |
| US12163892B2 | Accurate Raman spectroscopy | Physics | 0 | Active |
| US11543294B2 | Optical technique for material characterization | Physics | 0 | Active |
| US12152993B2 | Accurate Raman spectroscopy | Physics | 0 | Active |
| US12066385B2 | Raman spectroscopy based measurements in patterned structures | Physics | 0 | Active |
| US12025560B2 | Hybrid metrology method and system | Physics | 0 | Active |
| US11906434B2 | Raman spectroscopy based measurement system | Physics | 0 | Active |
| US12392733B2 | Combined ocd and photoreflectance method and system | Physics | 0 | Active |
| US12372473B2 | Accurate Raman spectroscopy | Physics | 0 | Active |
| US11927481B2 | Optical technique for material characterization | Physics | 0 | Active |
| US11415519B2 | Accurate Raman spectroscopy | Physics | 0 | Active |
| US11275027B2 | Raman spectroscopy based measurements in patterned structures | Physics | 0 | Active |
| US12359968B2 | Systems and methods for optical metrology | Electricity | 0 | Active |
| US11860104B2 | Accurate raman spectroscopy | Physics | 0 | Active |
| US12366533B2 | Hybrid metrology method and system | Physics | 0 | Active |
| US12298182B2 | Optical technique for material characterization | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.