Method for illuminating samples in microscopic imaging methods
US11555991B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 24, 2019 |
| Grant date | Jan 17, 2023 |
| Priority date | — |
| Expiry date | Oct 14, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/0076
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method for illuminating samples in microscopic imaging methods, wherein a number m of different wavelengths λi, with m>I and i=I, . . . , m, is selected for the illumination. For each of the wavelengths λi a target phase function Δφi(x, y, λi) is predefined, wherein x and y denote spatial coordinates in a plane perpendicular to an optical axis z and each target phase function Δφi(x, y, λi) is effective only for the corresponding wavelength λi. The target phase functions Δφi are predefined depending on the structure of the sample and/or the beam shape and/or illumination light structure to be impressed on the light used for illumination. A total phase mask is then produced which realises all target phase functions Δφi(x, y, λi). This total phase mask is then illuminated simultaneously or successively with coherent light of wavelengths λi such that the predefined structure of the illumination light is generated in the region of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.