Utilizing single cycle ATPG test patterns to detect multicycle cell-aware defects
US11579194B1 · kind B1 · utility
2Cited by
5References
20Claims
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Key dates
| Filing date | Jun 9, 2021 |
| Grant date | Feb 14, 2023 |
| Priority date | — |
| Expiry date | Jun 9, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2119/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit (IC) test engine can generate a plurality of single cycle test patterns that target a plurality of static single cycle defects of a fabricated IC chip based on an IC design. The IC test engine can also fault simulate the plurality of single cycle test patterns against a plurality of multicycle defects in the IC design, wherein a given single cycle test pattern of the plurality of single cycle test patterns is sim-shifted to enable detection of a given multicycle fault and/or defect of the plurality of multicycle faults and/or defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.