Arvind Chokhani
7Patents
1h-index
4Co-inventors
33Inventor score
Filing activity: Feb 19, 2021 → Jul 14, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11579194B1 | Utilizing single cycle ATPG test patterns to detect multicycle cell-aware defects | Physics | 2 | Active |
| US11429776B1 | Fault rules files for testing an IC chip | Physics | 1 | Active |
| US11740284B1 | Diagnosing multicycle faults and/or defects with single cycle ATPG test patterns | Physics | 1 | Active |
| US11892501B1 | Diagnosing multicycle transition faults and/or defects with AT-speed ATPG test patterns | Physics | 1 | Active |
| US11435401B1 | Timed transition cell-aware ATPG using fault rule files and SDF for testing an IC chip | Physics | 0 | Active |
| US11893336B1 | Utilizing transition ATPG test patterns to detect multicycle faults and/or defects in an IC chip | Physics | 0 | Active |
| US11461520B1 | SDD ATPG using fault rules files, SDF and node slack for testing an IC chip | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.