Texture detection apparatuses, systems, and methods for analysis
US11585654B2 · kind B2 · utility
1Cited by
1References
37Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 2, 2020 |
| Grant date | Feb 21, 2023 |
| Priority date | — |
| Expiry date | Jun 15, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2513
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments of the disclosure are drawn to projecting light on a surface and analyzing the scattered light to obtain spatial information of the surface and generate a three dimensional model of the surface. The three dimensional model may then be analyzed to calculate one or more surface characteristics, such as roughness. The surface characteristics may then be analyzed to provide a result, such as a diagnosis or a product recommendation. In some examples, a mobile device is used to analyze the surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.