Jonathan D. Harms
43Patents
3h-index
32Co-inventors
59Inventor score
Filing activity: May 18, 2012 → Mar 31, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10867655B1 | Methods and apparatus for dynamically adjusting performance of partitioned memory | Physics | 19 | Active |
| US9224447B2 | General structure for computational random access memory (CRAM) | Physics | 6 | Active |
| US9680089B1 | Magnetic tunnel junctions | Electricity | 4 | Active |
| US8634233B2 | Systems and methods for direct communication between magnetic tunnel junctions | Physics | 3 | Active |
| US11009798B2 | Wafer alignment markers, systems, and related methods | Electricity | 3 | Active |
| US11256778B2 | Methods and apparatus for checking the results of characterized memory searches | Emerging Cross-Sectional Technologies | 2 | Active |
| US10957416B2 | Methods and apparatus for maintaining characterized memory devices | Physics | 2 | Active |
| US9537088B1 | Magnetic tunnel junctions | Electricity | 2 | Active |
| US11217303B2 | Imprint recovery for memory arrays | Physics | 2 | Active |
| US11327551B2 | Methods and apparatus for characterizing memory devices | Emerging Cross-Sectional Technologies | 2 | Active |
| US11398264B2 | Methods and apparatus for dynamically adjusting performance of partitioned memory | Physics | 1 | Active |
| US11631473B2 | Imprint management for memory | Physics | 1 | Active |
| US11183266B2 | Apparatuses and methods for repairing defective memory cells based on a specified error rate for certain memory cells | Electricity | 1 | Active |
| US11422826B2 | Operational code storage for an on-die microprocessor | Physics | 1 | Active |
| US11585654B2 | Texture detection apparatuses, systems, and methods for analysis | Physics | 1 | Active |
| US9478735B1 | Magnetic tunnel junctions | Electricity | 1 | Active |
| US11094394B2 | Imprint management for memory | Physics | 0 | Active |
| US12158792B2 | Methods and apparatus for characterizing memory devices | Emerging Cross-Sectional Technologies | 0 | Active |
| US11520240B2 | Wafer alignment markers, systems, and related methods | Electricity | 0 | Active |
| US11914449B2 | Methods and apparatus for characterizing memory devices | Emerging Cross-Sectional Technologies | 0 | Active |
| US9960346B2 | Magnetic tunnel junctions | Electricity | 0 | Active |
| US9344345B2 | Memory cells having a self-aligning polarizer | Electricity | 0 | Active |
| US11430539B2 | Modifiable repair solutions for a memory array | Physics | 0 | Active |
| US12230546B2 | Wafer registration and overlay measurement systems and related methods | Electricity | 0 | Active |
| US10998080B2 | Imprint recovery for memory cells | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.